DL
N=9
TITLE = Citation pattern of IEEE T INSTRUM MEAS (cited)
FORMAT = FULLMATRIX DIAGONAL PRESENT
LABELS:
IeePSciMeasTech
IeeeTInstrumMeas
IeeeTMicrowTheory
IntJElectron
MeasSciTechnol
Measurement
Metrologia
PhysRevLett
RevSciInstrum
DATA:
0.000000 0.551892 0.000000 0.000000 0.212873 0.219807 0.000000 0.000000 0.000000 
0.551892 0.000000 0.000000 0.000000 0.261781 0.471896 0.415904 0.000000 0.000000 
0.000000 0.000000 0.000000 0.000000 0.000000 0.000000 0.000000 0.000000 0.000000 
0.000000 0.000000 0.000000 0.000000 0.000000 0.000000 0.000000 0.000000 0.000000 
0.212873 0.261781 0.000000 0.000000 0.000000 0.273610 0.283652 0.000000 0.337744 
0.219807 0.471896 0.000000 0.000000 0.273610 0.000000 0.000000 0.000000 0.000000 
0.000000 0.415904 0.000000 0.000000 0.283652 0.000000 0.000000 0.000000 0.000000 
0.000000 0.000000 0.000000 0.000000 0.000000 0.000000 0.000000 0.000000 0.000000 
0.000000 0.000000 0.000000 0.000000 0.337744 0.000000 0.000000 0.000000 0.000000